Distribution-Free Statistical Tests
Report Number: WADD TR 60-661
Author(s): Bradley, James V.
Corporate Author(s): Behavioral Sciences Laboratory Aerospace Medical Division
Laboratory: Behavioral Sciences Laboratory
Date of Publication: 1960-08
Pages: 388
Contract: Laboratory Research - No Contract
DoD Project: 7184
DoD Task: 71581
PB Number: PB171312
Identifier: AD0249268
Abstract:
As a result of an extensive survey of the literature, a large number of distribution-free statistical tests are examined. Tests are grouped together primarily according to general type of mathematical derivation or type of statistical "information" used in conducting the test. Each of the more important tests is treated under the headings: Rationale, Null Hypothesis, Assumptions, Treatment of Ties, Efficiency, Application, Discussion, Tables, and Source. Derivations are given and mathematical interrelationships among the tests are indicated. Strengths and weaknesses of individual tests, and of distribution-free tests as a class compared to parametric tests, are discussed.
Provenance: IIT
Author(s): Bradley, James V.
Corporate Author(s): Behavioral Sciences Laboratory Aerospace Medical Division
Laboratory: Behavioral Sciences Laboratory
Date of Publication: 1960-08
Pages: 388
Contract: Laboratory Research - No Contract
DoD Project: 7184
DoD Task: 71581
PB Number: PB171312
Identifier: AD0249268
Abstract:
As a result of an extensive survey of the literature, a large number of distribution-free statistical tests are examined. Tests are grouped together primarily according to general type of mathematical derivation or type of statistical "information" used in conducting the test. Each of the more important tests is treated under the headings: Rationale, Null Hypothesis, Assumptions, Treatment of Ties, Efficiency, Application, Discussion, Tables, and Source. Derivations are given and mathematical interrelationships among the tests are indicated. Strengths and weaknesses of individual tests, and of distribution-free tests as a class compared to parametric tests, are discussed.
Provenance: IIT