High Resolution Cathode Ray Tube Evaluation
Report Number: ASD-TDR-63-796
Corporate Author(s): Data Corporation
Laboratory: Director of Reconnaissance Engineering
Date of Publication: 1964-04
Pages: 104
Contract: AF33(616)-4206
DoD Task:
Identifier: AD0600517
Abstract:
This report outlines and provides a means of comparing the four basic methods of CRT testing now employed by the cathode ray tube industry. An analysis of each test method, its restrictions, limitations, and advantages are discussed along with the basic requirements for testing cathode ray tubes. These four methods are selected by a joint industry-government committee as possible test standards. They are: (1) Shrinking Raster Technique, (2) Schade Spatial Frequency Technique, (3) Line Profile and Single Slit Technique, (4) Double Line Trace Technique (Westinghouse Method). Five high resolution cathode ray tubes were subjected to the four methods of tests and the results indicated for comparison. The appendix gives a detailed description of the CRT Analyser designed and built by Data Corporation for performing the various tests described.
Provenance: IIT
Corporate Author(s): Data Corporation
Laboratory: Director of Reconnaissance Engineering
Date of Publication: 1964-04
Pages: 104
Contract: AF33(616)-4206
DoD Task:
Identifier: AD0600517
Abstract:
This report outlines and provides a means of comparing the four basic methods of CRT testing now employed by the cathode ray tube industry. An analysis of each test method, its restrictions, limitations, and advantages are discussed along with the basic requirements for testing cathode ray tubes. These four methods are selected by a joint industry-government committee as possible test standards. They are: (1) Shrinking Raster Technique, (2) Schade Spatial Frequency Technique, (3) Line Profile and Single Slit Technique, (4) Double Line Trace Technique (Westinghouse Method). Five high resolution cathode ray tubes were subjected to the four methods of tests and the results indicated for comparison. The appendix gives a detailed description of the CRT Analyser designed and built by Data Corporation for performing the various tests described.
Provenance: IIT