Stress Screening of Electronic Hardware
This citation is provided as a resource for researchers, but Contrails cannot provide a full-text download
U.S. government employees, Military/Department of Defense employees, and U.S. government contractors and sub-contractors may be eligible to register with the Defense Technical Information Center (DTIC), where this report and others like it may be available
Report Number: RADC TR 82-87
Author(s): Saari, A. E., Schafer, R. E, VanDenBerg, S. J.
Corporate Author(s): Hughes Aircraft Company
Laboratory: Rome Air Development Center
Date of Publication: 1982-05-01
Pages: 224
Contract: F30602-80-C-0250
DoD Project: 2338
DoD Task: 233802
Identifier: ADA118261
Abstract:
This report presents the results of a study to develop quantitative and qualitative techniques for planning, monitoring and evaluating stress screening programs during electronic equipment development and production. A screening and debugging optimization (SDO) model developed on a prior study, RADC-TR-78-55, was revised to include current thermal cycling and vibration screening experience and an adaptive feature was added to allow stress screening program changes based on screening results.
Author(s): Saari, A. E., Schafer, R. E, VanDenBerg, S. J.
Corporate Author(s): Hughes Aircraft Company
Laboratory: Rome Air Development Center
Date of Publication: 1982-05-01
Pages: 224
Contract: F30602-80-C-0250
DoD Project: 2338
DoD Task: 233802
Identifier: ADA118261
Abstract:
This report presents the results of a study to develop quantitative and qualitative techniques for planning, monitoring and evaluating stress screening programs during electronic equipment development and production. A screening and debugging optimization (SDO) model developed on a prior study, RADC-TR-78-55, was revised to include current thermal cycling and vibration screening experience and an adaptive feature was added to allow stress screening program changes based on screening results.