Impact of Nonoperating Periods on Equipment Reliability
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Report Number: RADC-TR-85-91
Author(s): Coit, David W., Priore, Mary G.
Corporate Author(s): IIT Research Institute
Laboratory: Rome Air Development Center
Date of Publication: 1985-05
Pages: 441
Contract: F30602-83-C-0056
DoD Project: 2338
DoD Task: 233802
Identifier: ADA158843
Abstract:
The objective of this study was to develop a procedure to predict the quantitative effects of nonoperating periods on electronic equipment reliability. A series of nonoperating failure rate prediction models were developed at the component level. The models are capable of evaluating component nonoperating failure rate for any anticipated environment with the exception of a satellite environment. The proposed nonoperating failure rate prediction methodology is intended to provide the ability to predict the component nonoperating failure rate and reliability as a function of the characteristics of the devices, technology employed in producing the device, and external factors such as environmental stresses which have a significant effect on device nonoperating reliability. The prediction methodology is presented in a form compatible with MIL-HDBK-217 as an Appendix to the technical report. Additional keywords: Dormancy; Power on off cycling; Tables(Data); Data acquisition; Mathematical models; Microcircuits; Discrete semiconductors; Resistors; Capacitors; Inductive devices; Lasers; Tubes; Mechanical/electromechanical devices; and Circuit interconnectors.
Provenance: Underwriters Laboratories (UL)
Author(s): Coit, David W., Priore, Mary G.
Corporate Author(s): IIT Research Institute
Laboratory: Rome Air Development Center
Date of Publication: 1985-05
Pages: 441
Contract: F30602-83-C-0056
DoD Project: 2338
DoD Task: 233802
Identifier: ADA158843
Abstract:
The objective of this study was to develop a procedure to predict the quantitative effects of nonoperating periods on electronic equipment reliability. A series of nonoperating failure rate prediction models were developed at the component level. The models are capable of evaluating component nonoperating failure rate for any anticipated environment with the exception of a satellite environment. The proposed nonoperating failure rate prediction methodology is intended to provide the ability to predict the component nonoperating failure rate and reliability as a function of the characteristics of the devices, technology employed in producing the device, and external factors such as environmental stresses which have a significant effect on device nonoperating reliability. The prediction methodology is presented in a form compatible with MIL-HDBK-217 as an Appendix to the technical report. Additional keywords: Dormancy; Power on off cycling; Tables(Data); Data acquisition; Mathematical models; Microcircuits; Discrete semiconductors; Resistors; Capacitors; Inductive devices; Lasers; Tubes; Mechanical/electromechanical devices; and Circuit interconnectors.
Provenance: Underwriters Laboratories (UL)