The Mechanism of Boundary Migration in Recrystallization

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Author(s): Vandermeer, R. A.
Corporate Author(s): Illinois Institute of Technology
Date of Publication: 1961-08
Pages: 73
Contract: DA 11-022-ORD-1984
DoD Task:
PB Number: PB 162 360

Abstract:
On the basis of a unified concept, theoretical expressions for grain boundary migration in recrystallization are derived for impurity controlled and impurity-independent migration. Quantitative experimental data for boundary migration in the recrystallization of polycrystalline zone-refined aluminum and in binary "alloys" of this aluminum with 0.00021, 0.00043, 0.00017, 0.0034, 0.0068, 0.0124 and 0.0256 atomic percent copper, respectively, are presented.

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