Instrumentation and Measurement Techniques Study
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Author(s):
Shaifer, T. R.
Corporate Author(s): Armour Research Foundation
Corporate Report Number: ARF 5112-Q15
Date of Publication: 1962-10-31
Pages: 71
Contract: DA 36-039-sc-78269
DoD Task:
AD Number: AD-294 611
Abstract:
A practical in-circuit transistor leakage current tester is described. This device requires only simple operating procedures, and is capable of reading leakages below one microamp. The leakage tester actually constructed has measured leakages as low as one microampere with a collector load of 500 ohms. A theoretical computer study of fault location on open wire transmission lines utilizing the pulse echo technique was completed. Theoretical and experimental research indicates that the storage type oscilloscope method should allow the rapid location of faults on open wire transmission lines with a simple electronic test system. A study of the problem of rapid fault location of modules or components in electronic systems by internal means was initiated. Two methods are described. One method uses chemical voltage indicator cells, which exhibit a color change when the voltage across the terminals exceeds approximately 1.6 volts dc, and the other method uses small ferrite core indicators, which give an output signal variation proportional to the amount of dc current in a wire.
Corporate Author(s): Armour Research Foundation
Corporate Report Number: ARF 5112-Q15
Date of Publication: 1962-10-31
Pages: 71
Contract: DA 36-039-sc-78269
DoD Task:
AD Number: AD-294 611
Abstract:
A practical in-circuit transistor leakage current tester is described. This device requires only simple operating procedures, and is capable of reading leakages below one microamp. The leakage tester actually constructed has measured leakages as low as one microampere with a collector load of 500 ohms. A theoretical computer study of fault location on open wire transmission lines utilizing the pulse echo technique was completed. Theoretical and experimental research indicates that the storage type oscilloscope method should allow the rapid location of faults on open wire transmission lines with a simple electronic test system. A study of the problem of rapid fault location of modules or components in electronic systems by internal means was initiated. Two methods are described. One method uses chemical voltage indicator cells, which exhibit a color change when the voltage across the terminals exceeds approximately 1.6 volts dc, and the other method uses small ferrite core indicators, which give an output signal variation proportional to the amount of dc current in a wire.