Test Procedure For Short-life Rating Of Composition Resistors
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Report Number: WADC TR 53-349
Author(s): Bridges, D. B. J., Graham, J. H., Sackett, W. T.
Corporate Author(s): Battelle Memorial Institute
Date of Publication: 1953-07
Pages: 98
Contract: AF 33(038)-1229
DoD Task:
PB Number: PB122120
Identifier: AD0018756
Abstract:
A short-life rating procedure is given for abnormal operation of composition resistors. Consideration was given to high ambient temperature, altitude, load, humidity, and vibration. Details of equipment, methods of measurement, and mounting of samples are described. The rating procedure utilizes sequential sampling, pre-conditioning of resistors, and statistical treatment of the data. Theoretical and experimental considerations leading to the procedure are given. The applicability of the rating procedure to other electronic components is indicated.
Author(s): Bridges, D. B. J., Graham, J. H., Sackett, W. T.
Corporate Author(s): Battelle Memorial Institute
Date of Publication: 1953-07
Pages: 98
Contract: AF 33(038)-1229
DoD Task:
PB Number: PB122120
Identifier: AD0018756
Abstract:
A short-life rating procedure is given for abnormal operation of composition resistors. Consideration was given to high ambient temperature, altitude, load, humidity, and vibration. Details of equipment, methods of measurement, and mounting of samples are described. The rating procedure utilizes sequential sampling, pre-conditioning of resistors, and statistical treatment of the data. Theoretical and experimental considerations leading to the procedure are given. The applicability of the rating procedure to other electronic components is indicated.