An X-Ray Diffraction Study of Crystal Perfection in Silicon

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Report Number: AFOSR-TN-60-632
Author(s): Bragg, R. H., Azaroff, L. V.
Corporate Author(s): Illinois Inst. of Tech. Dept. of Metallurgical Engineering
Date of Publication: 1960-06-24
Pages: 8
Contract: AF 49(638)425
DoD Task:
PB Number: PB148778
Identifier: AD0239726
AD Number: AD 239726

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