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Chemical Analysis of Solid State Materials by Mass Spectrometry
Author(s): Baun, William L.Corporate Author(s): Directorate of Materials and Processes
Laboratory: Aeronautical Systems Division
Date of Publication: 1961-07
Report number: ASD TR 61-322 p. 196-216
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Low Temperature X-Ray Diffraction Techniques: I. Review and Bibliography II. A Low Temperature Specimen Mount for the Siemens Horizontal Diffractometer
Author(s): Baun, William L., Renton, John J.Corporate Author(s): Directorate of Materials and Processes
Laboratory: Directorate of Materials and Processes
Date of Publication: 1963-04
Report number: ASD TDR 63-278
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