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Fault Tolerant VLSI Design Using Error Correcting Codes
Author(s): Hartmann, C. R. P., Ali, A. M., Ganguly, S., Visweswaran, G. S., Lala, P. K.Corporate Author(s): Syracuse University
Laboratory: Rome Air Development Center
Date of Publication: 1989-02
Report number: RADC-TR-88-321
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Impact of Nonoperating Periods on Equipment Reliability
Author(s): Coit, David W., Priore, Mary G.Corporate Author(s): IIT Research Institute
Laboratory: Rome Air Development Center
Date of Publication: 1985-05
Report number: RADC-TR-85-91
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