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Stress Screening of Electronic Hardware
Author(s): Saari, A. E., Schafer, R. E, VanDenBerg, S. J.Corporate Author(s): Hughes Aircraft Company
Laboratory: Rome Air Development Center
Date of Publication: 1982-05-01
Report number: RADC TR 82-87
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RADC Thermal Guide for Reliability Engineers
Author(s): Morrison, Gerald N., Kallis, James M., Stratton, Landon A., Jones, Ivan R., Lena, August L.Corporate Author(s): Hughes Aircraft Company
Date of Publication: 1982-06
Report number: RADC-TR-82-172
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