2 items

full text by request
Some Specialized Attachments For The Siemens X-Ray Diffractometer
Author(s): Renton, John J., Baun, William L.
Corporate Author(s): Air Force Materials Lab Wright-Patterson AFB Ohio
Laboratory: AF Materials Laboratory
Date of Publication: 1963-06
Report number: ASD TDR 63-469
full text by request
Low Temperature X-Ray Diffraction Techniques: I. Review and Bibliography II. A Low Temperature Specimen Mount for the Siemens Horizontal Diffractometer
Author(s): Baun, William L., Renton, John J.
Corporate Author(s): Directorate of Materials and Processes
Laboratory: Directorate of Materials and Processes
Date of Publication: 1963-04
Report number: ASD TDR 63-278